Precise dielectric properties determination of laminar-shaped materials in a partially-filled waveguide

IEEE Antennas and Propagation Society International Symposium: Wireless Technologies and Information Networks, APS 1999 - Held in conjunction with USNC/URSI National Radio Science Meeting

Volumn 3, Issue , 1999, Pages 1942-1945

  Catala Civera J M ^a   Penaranda Foix F ^a   Sanchez Hernandez D ^a   De Los Reyes, E ^a  

^a UNIVERSITAT POLITÈCNICA DE VALÈNCIA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; DIELECTRIC PROPERTIES; INFORMATION SERVICES; MICROSTRIP ANTENNAS; WAVEGUIDES; WIRELESS TELECOMMUNICATION SYSTEMS;

DIELECTRIC SUBSTRATES; MEASUREMENTS OF; PARTIALLY FILLED WAVEGUIDES; SCATTERING MEASUREMENTS;

DIELECTRIC MATERIALS;

EID: 0003082928     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/APS.1999.788338     Document Type: Conference Paper

References (5)

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2. R. Thomas and D. C. Dube, "Extended technique for complex permittivity measurements of dielectric films in the microwave region", Electronics Letters, Vol. 33, no. 3, pp. 218-220, January 1997.
3. W. B. Weir, "Automatic Measurement of Complex Dielectric Constant and Permeability at Microwave Frequencies", Proceedings of the IEEE, Vol 62, No 1, pp. 33-36, January 1974.
4. C. A. Balanis, "Advanced Engineering Electromagnetics", John Wiley & Sons, pp. 394-410, 1989.
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