Soft X-ray fluorescence yield XMCD sum rules

Journal of Electron Spectroscopy and Related Phenomena

Volumn 86, Issue 1-3, 1997, Pages 143-150

  Goedkoop, J B ^a   Brookes, N B ^a   Van Veenendaal, Michel ^a   Thole, B T ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Sum rules; X ray absorption; X ray fluorescence; XMCD

Indexed keywords

EID: 0003056826     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(97)00060-1     Document Type: Article

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