Polarized X-ray Fluorescence as a Probe of Ground State Properties

Physical Review Letters

Volumn 77, Issue 8, 1996, Pages 1508-1511

  van Veenendaal, Michel ^a   Goedkoop, J B ^a   Thole, B T ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001646389     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.77.1508     Document Type: Article

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