Recent developments in TXRF with various excitation sources

Journal of Trace and Microprobe Techniques

Volumn 14, Issue 1, 1996, Pages 103-117

  Wobrauschek, Peter ^a   Streli, Christina ^a   Kregsamer, Peter ^a   Ladisich, Wolfgang ^a   Rieder, Robert ^a  

^a TU WIEN   (Austria)

Author keywords

EDXRF; Surface analysis; Synchrotron radiation; TXRF; Ultra trace element analysis; X ray tubes detection limits

Indexed keywords

EID: 0001527078     PISSN: 07334680     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (18)

1. Yoneda Y. , Horiuchi T.(1971),Optical flats for use in X ray spectrochemical microanalysis, Review of Sci.Inst. 42(7)1069
2. Aiginger H.,Wobrauschek P.(1974) A method for quantitative XRF analysis in the nanogram region, Nucl. Instr. Meth. 114, 157
3. Wobrauschek P., Aiginger H. ,(1975) Total-reflection X-ray fluorescence spectrometric determination of elements in nanogram amounts ,Anal. Chem. 47(6), 852
4. Knoth J., Schwenke H., (1978), An X-ray fluorescence spectrometer with totally reflecting sample support for trace analysis at the ppb level,Fresenius Z. Anal. Chem. 291,200
5. Klockenkämper R., KnothJ., Prange A., Schwenke H.,(1992) Total Reflection X-ray Fluorescence Spectroscopy, Anal. Chem. 64(23),1115A
6. P.Wobrauschek, (1995)Total reflection XRF with polarized radiation,J. Trace and Microprobe Techn. 13(2),83
7. G.Tölg and R.Klockenkämper, Spectrochim. Acta 48B, 111 (1993)
8. R. P. Petterson, P. Wobrauschek, Nucl. Instr. Meth. A355, 665 (1995)
9. W.Ladisich, R.Rieder, P.Wobrauschek and H.Aiginger, Nucl.Instrum.Meth A330, 501 (1993)
10. P. Kregsamer and P. Wobrauschek, Spectrochim. Acta 46B, 1361 (1991).
11. C.Streli,P.Wobrauschek,H.Aiginger , A new X-ray tube for eficient excitation of low-Z-elements with total reflection X-ray fluorescence analysis, Spectrochim. Acta 46B, 1351 (1991).
12. C.Streli, P.Wobrauschek, W.Ladisich,R. Rieder, H.Aiginger, R.Ryon, P.Pianetta, Nucl.Instr. Meth. A345,399 (1994)
13. Ch. Streli, P. Wobrauschek, E. Unfried and H. Aiginger, Nucl. Instr. Meth. A334, 425, (1993).
14. R.Rieder, P.Wobrauschek, W.Ladisich, C.Streli, H.Aiginger, S.Garbe, G.Gaul, A.Knöchel, F.Lechtenberg, Nucl. Instr. Meth. 355(2,3),648 (1995)
15. R.Day,J. Grosso,R. Bartlett, Nucl. Instr. Meth.208,245 (1983)
16. H.Schwenke and J.Knoth, Nucl.Instr.Meth. 193,239 (1982)
17. H.Aiginger, P.Wobrauschek, Adv. X-ray Anal. 28,1 (1985)
18. A. Prange, H. Schwenke,Sample treatments for TXRF - Requirements and Prospects, Adv. X-ray Anal. 32,211 (1989)