Submicron external electro-optic measuring system based on an electro-optic solid immersion lens

International Journal of Infrared and Millimeter Waves

Volumn 22, Issue 5, 2001, Pages 695-702

  Chen, Zhanguo ^a   Jia, Gang ^a   Liu, Yunlong ^a   Wu, Zhifa ^a   Zhao, Chao ^a   Yi, Maobin ^a  

^a JILIN UNIVERSITY   (China)

Author keywords

Electro optic measurement; Solid immersion lens; Spatial resolution; Sub micron

Indexed keywords

ELECTROMAGNETIC WAVE DIFFRACTION; ELECTROOPTICAL EFFECTS; MICROSTRIP LINES; OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; SEMICONDUCTING GALLIUM ARSENIDE;

ELECTRO-OPTIC MEASUREMENT; SOLID IMMERSION LENSES; SPATIAL RESOLUTION; SUB-MICRON;

OPTICAL INSTRUMENT LENSES;

EID: 0002861391     PISSN: 01959271     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1010645726332     Document Type: Article

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