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Volumn 12, Issue 5, 1999, Pages 40-42

Recent developments of the scanning photoelectron microscope at ELETTRA

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0002827840     PISSN: 08940886     EISSN: 19317344     Source Type: Journal    
DOI: 10.1080/08940889908261037     Document Type: Article
Times cited : (16)

References (9)
  • 3
    • 85071345261 scopus 로고    scopus 로고
    • Thieme J., Schmahl G., Rudolph D., Umbach E., (eds), Proc. Fifth Int. Conf. XRM 96, 1998, Berlin, Heidelberg: Springer-Verlag, and,. Edited by
    • Schliebe, T., and Schneider, G., Proc. Fifth Int. Conf. XRM 96. 1998. Edited by: Thieme, J., Schmahl, G., Rudolph, D., and Umbach, E., Vol. IV, pp. 3Berlin, Heidelberg: Springer-Verlag.
    • , vol.4 , pp. 3
    • Schliebe, T.1    Schneider, G.2
  • 4
    • 0001129090 scopus 로고    scopus 로고
    • The AFM and SPEM data belong to J. Vogel and collaborators from CNRS, Grenoble France
    • Spector, S. J., Jacobsen, C. J., and Tennant, D. M., 1997. J. Vac. Sci. Technol. B, 15: 2872 The AFM and SPEM data belong to J. Vogel and collaborators from CNRS, Grenoble France
    • (1997) J. Vac. Sci. Technol. B , vol.15 , pp. 2872
    • Spector, S.J.1    Jacobsen, C.J.2    Tennant, D.M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.