Comparison of thiacalix[4]arene thin films behaviour on different transducers for copper ion detection

Materials Science and Engineering C

Volumn 7, Issue 2, 1999, Pages 83-89

  Ali, M Ben ^a,b   Bureau, C ^c   Martelet, C ^a   Jaffrezic Renault, N ^a   Lamartine, R ^c   Ben Ouada, H ^b  

^a ECOLE CENTRALE DE LYON   (France)

^b FACULTÉ DES SCIENCES DE MONASTIR   (Tunisia)

^c UNIVERSITÉ LYON 1   (France)

Author keywords

Copper ions; EIS; Impedance spectroscopy; ISFET; Thiacalix 4 arene

Indexed keywords

EID: 0002587082     PISSN: 09284931     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0928-4931(99)00128-9     Document Type: Article

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