Scanning electron microscopy characterization of ZnSe single crystals grown by Solid-Phase Recrystallization

Materials Science and Engineering B: Solid-State Materials for Advanced Technology

Volumn 78, Issue 2-3, 2000, Pages 105-108

  Urbieta, A ^a   Fernandez P ^a   Piqueras, J ^a   Munoz V ^b  

^a UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

^b UNIVERSITY OF VALENCIA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CATHODOLUMINESCENCE; CRYSTALLIZATION; DISLOCATIONS (CRYSTALS); ELECTRONIC PROPERTIES; ETCHING; POLISHING; PRESSURE EFFECTS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR GROWTH; SINGLE CRYSTALS; TWINNING;

SOLID PHASE RECRYSTALLIZATION (SPR); ZINC SELENIDE;

SEMICONDUCTING ZINC COMPOUNDS;

EID: 0002583314     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(00)00523-7     Document Type: Article

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