Deformation-induced defect levels in ZnSe crystals

Semiconductor Science and Technology

Volumn 14, Issue 5, 1999, Pages 430-434

  Fernandez P ^a   Piqueras, J ^a   Urbieta, A ^a   Rebane, Y T ^b   Shreter, Y ^b  

^a UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

^b IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODOLUMINESCENCE; CRYSTAL DEFECTS; INFRARED SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS;

DARK SLIP BANDS; ZINC SELENIDE;

SEMICONDUCTING ZINC COMPOUNDS;

EID: 0342391184     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/14/5/010     Document Type: Article

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