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Volumn 73, Issue 3, 1996, Pages 487-502

Properties of a-SiNx.: H films deposited at room temperature by the electron cyclotron resonance plasma method

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0002276843     PISSN: 13642812     EISSN: None     Source Type: Journal    
DOI: 10.1080/13642819608239130     Document Type: Article
Times cited : (25)

References (40)
  • 11
    • 0003666012 scopus 로고
    • 2nd edition (New York: Wiley), Handbook of Auger Electron Spectroscopy, 1976, 2nd edition (Eden Prairie, MN: Physical Electronics Industries)
    • Ghandhi, S. K., 1993, VLSI Fabrication Principles, 2nd edition (New York: Wiley), Chap. 8. Handbook of Auger Electron Spectroscopy, 1976, 2nd edition (Eden Prairie, MN: Physical Electronics Industries).
    • (1993) VLSI Fabrication Principles , vol.8
    • Ghandhi, S.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.