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Volumn 56 B56, Issue 1, 1998, Pages 5-10

Thermal oxidation of cleft surface of InSe single crystal

Author keywords

Cleft surface; In2O3; Inse; Layer semiconductors; Phase formation; Thermal oxidation

Indexed keywords

ADSORPTION; CATHODOLUMINESCENCE; CRYSTAL DEFECTS; OXIDATION; PHASE TRANSITIONS; SINGLE CRYSTALS; THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS;

EID: 0002055257     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0921-5107(98)00213-x     Document Type: Article
Times cited : (37)

References (33)
  • 21


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.