Eigenhill vs. eigenface and eigenedge

Proceedings - International Conference on Pattern Recognition

Volumn 15, Issue 2, 2000, Pages 827-830

  Yilmaz, Alper ^a   Gökmen, Muhittin ^a  

^a ISTANBUL TECHNICAL UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

PATTERN RECOGNITION; SOFTWARE ENGINEERING;

EDGE IMAGE; EIGENFACES; FACE DATABASE; ILLUMINATION CHANGES; INTENSITY VALUES; NEW APPROACHES; ORIENTATION CHANGES;

FACE RECOGNITION;

EID: 0002015045     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (7)

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2. M. Turk, A. Pentland, "Eigenfaces for recognition", Journal of Cognitive Sciences Vol.3 Num.1, 1991, pp71-86.
3. S.K. Nayar, H. Murase, S.A. Nene, "Parametric appearance representation," from Early Visual Learning, Oxford University Press 1996, pp131-160.
4. B. Tàcacs and H. Wescler, "Face recognition using binary image metrics," Proc. of the 3rd Int. Conf. on Automatic Face and Gesture Recognition, Nara, Japan, April 1998, pp294-299.
5. P.N. Belhumeur, J.P. Hespanha and D.J. Kriegman, "Eigenfaces vs. Fischerfaces: Recognition Using Class Specific Linear Projection," IEEE PAMI, Vol. 19, No. 7, July 1997.
6. th International Conference on Image Analysis and Processing, (ICIAP'99) Venice, Italy September 1999.
7. Purdue Face Database, http://rvl1.ecn.purdue.edu/~aleix/aleix_face_DB.html