Face recognition using binary image metrics

Proceedings - 3rd IEEE International Conference on Automatic Face and Gesture Recognition, FG 1998

Volumn , Issue , 1998, Pages 294-299

  Takács, Barnás ^a   Wechsler, Hany ^b  

^a Waveband Inc   (United States)

^b Krasnow Institute for Advanced Study   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FACE SIMILARITY MEASURES; FAST SCREENING; HAUSDORFF DISTANCE; NEIGHBORHOOD FUNCTION; NOVEL METHODOLOGY; SHAPE COMPARISON; SIMILARITY MEASURE; VISUAL-PROCESSING;

FACE RECOGNITION;

EID: 1542319870     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AFGR.1998.670964     Document Type: Conference Paper

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