Copper(I) cyanide-thiomorpholine (3/1)

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 55, Issue 12, 1999, Pages 2014-2016

  Britton, Doyle ^a   Stocker, Fred B ^b   Staeva, Teodora P ^b  

^a UNIVERSITY OF MINNESOTA   (United States)

^b MACALESTER COLLEGE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001882799     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270199011622     Document Type: Article

References (7)

1. Enraf-Nonius (1977). CAD-4 Operations Manual. Enraf-Nonius, Delft, The Netherlands.
2. Molecular Structure Corporation (1985). TEXSAN. TEXRAY Structure Analysis Package. MSC, 3200 Research Forest Drive, The Woodlands, TX 77381, USA.
3. North, A. C. T., Phillips, D. C. & Mathews, F. S. (1968). Acta Cryst. A24, 351-359.
4. Sheldrick, G. M. (1994). SHELXTL/PC. Version 5.0. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
5. Stocker, F. B. & Britton, D. (1999). Unpublished work.
6. Stocker, F. B., Staeva, T. P., Rienstra, C. M. & Britton, D. (1999). Inorg. Chem. 38, 984-991.
7. Stocker, F. B., Troester, M. A. & Britton, D. (1996). Inorg. Chem. 35, 3145-3153.