Near‐field optical microscopy in transmission and reflection modes in combination with force microscopy

Journal of Microscopy

Volumn 171, Issue 2, 1993, Pages 95-105

  VAN HULST, N F ^a   MOERS, M H P ^a   BOLGER B ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

AFM; atomic force; correlative imaging; development; evanescent wave; feedback; integrated microscopes; near field optics; Scanning probe microscopy; SNOM

Indexed keywords

ATOMIC FORCE MICROSCOPY; MICROSCOPY; REVIEW;

EID: 0027182733     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.1993.tb03363.x     Document Type: Review

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