A microstructural study of annealed Ti/Co/Cu/Co/MnFe/Ti spin-valve films

Applied Physics Letters

Volumn 72, Issue 1, 1998, Pages 118-120

  Portier, X ^a   Petford Long, A K ^a   Bayle Guillemaud, P ^a   Anthony, T C ^b   Brug, J A ^b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001806705     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120662     Document Type: Article

References (10)

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