Contactless electroreflectance characterization of GaInP/GaAs heterojunction bipolar transistor structures

Applied Physics Letters

Volumn 73, Issue 2, 1998, Pages 214-216

  Huang, Y S ^a   Sun, W D ^a   Pollak, Fred H ^a   Freeouf, J L ^b   Calder, I D ^c   Mallard, R E ^c  

^a CITY UNIVERSITY OF NEW YORK   (United States)

^b Interface Studies Inc   (United States)

^c NORTEL NETWORKS   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001749314     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121759     Document Type: Article

References (18)

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