Improved quality of CuGaSe2 and CuAlSe2 epilayers grown on CuGa0.96In0.04Se2 substrates

Applied Physics Letters

Volumn 71, Issue 4, 1997, Pages 533-535

  Chichibu, Shigefusa ^a   Nakanishi, Hisayuki ^a   Shirakata, Sho ^b   Isomura, Shigehiro ^b   Miyake, Hideto ^c   Sugiyama, Koichi ^c  

^a TOKYO UNIVERSITY OF SCIENCE   (Japan)

^b EHIME UNIVERSITY   (Japan)

^c MIE UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001679741     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119600     Document Type: Article

References (14)

1. For a review, see for example, J. L. Shay and J. H. Wernick, Ternary Chalcopyrite Semiconductors: Growth, Electronic Properties, and Applications (Pergamon, Oxford, 1975).
2. S. Shirakata, S. Chichibu, R. Sudo, A. Ogawa, S. Matsumoto, and S. Isomura, Jpn. J. Appl. Phys. 32, L1304 (1993).
3. For a review of the epitaxial growth of chalcopyrite compounds, see for example, K. J. Bachmann, G.-C. Xing, J. S. Scroggs, H. T. Tran, K. Ito, H. Castleberry, and G. Wood, Jpn. J. Appl. Phys. 32, 133 (1993); H. Kukimoto ibid. 32, 10 (1993).
4. For a review of the epitaxial growth of chalcopyrite compounds, see for example, K. J. Bachmann, G.-C. Xing, J. S. Scroggs, H. T. Tran, K. Ito, H. Castleberry, and G. Wood, Jpn. J. Appl. Phys. 32, 133 (1993); H. Kukimoto ibid. 32, 10 (1993).
5. 2 alloys, respectively.
6. 2 alloys, respectively.
7. 2 alloys, respectively.
8. 2 alloys, respectively.
9. S. Shirakata and S. Chichibu, J. Appl. Phys. 79, 2043 (1996).
10. K. Sugiyama, K. Mori, and H. Miyake, J. Cryst. Growth 113, 390 (1991).
11. K. Sugiyama, H. Kato, and H. Miyake, J. Cryst. Growth 98, 610 (1989).
12. S. Niki, P. J. Fons, A. Yamada, T. Kurafuji, S. Chichibu, H. Nakanishi, W. G. Bi, and C. W. Tu, Appl. Phys. Lett. 69, 647 (1996).
13. S. Shirakata, S. Chichibu, S. Isomura, and H. Nakanishi, Jpn. J. Appl. Phys. 36, L543 (1997).
14. S. Shirakata, S. Chichibu, H. Miyake, S. Isomura, H. Nakanishi, and K. Sugiyama, presented at the 43rd Spring Meeting of the Japan Society of Applied Physics and Related Societies, Asaka, Japan, 27 March 1996 (unpublished), 27p-ZE-8.