Refractometer for tracking changes in the refractive index of air near 780 nm

Applied Optics

Volumn 37, Issue 1, 1998, Pages 156-161

  Khelifa N ^a   Fang, H ^a   Xu, J ^a,b   Juncar, P ^a   Himbert, M ^a,c  

^a Bioinformatique et Chimie Moléculaire   (France)

^b NATIONAL INSTITUTE OF METROLOGY   (China)

^c UNIVERSITÉ PARIS 13   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001662586     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.000156     Document Type: Article

References (7)

1. T. J. Quinn, “Mise en pratique of the definition of the Metre (1992), ” Metrologia 30, 523-541 (1993/94).
2. M. Andersson, L. Eliasson, and L. R. Pendrill, “Compressible Fabry Perot refractometer, ” Appl. Opt. 26, 4835-4840 (1987).
3. O. Acef, F. Nez, and G. D. Rovera, “Optical heterodyning with a frequency difference of 1 THz in the 850-nm range, ” Opt. Lett. 19, 1275-1277 (1994).
4. 2 state via high precision saturated absorption spectroscopy, ” Opt. Lett. 21, 1280-1282 (1996).
5. D. W. Allan, “Statistics of atomic frequency standards, ” Proc. IEEE 54, 221-230 (1966).
6. E. Zimmermann, Y. Salvade, and R. Dandliker, “Stabilized three-wavelength source calibrated by electronic means for high-accuracy absolute distance measurement, ” Opt. Lett. 21, 531-533 (1996).
7. K. P. Birch and M. J. Downs, “Correction to the updated Edlen equation for the refractive index of air, ” Metrologia 31, 315-316(1994).