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Volumn 37, Issue 9, 1998, Pages 2630-2633

Practical designs for thin film wave plates

Author keywords

Birefringence; Thin films; Wave plates

Indexed keywords


EID: 0001656461     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.601763     Document Type: Article
Times cited : (23)

References (13)
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  • 2
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  • 3
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    • Measurement of the principal refractive indices of thin films deposited at oblique incidence
    • I. J. Hodgkinson, F. Horowitz, H. A. Macleod, M. Sikkens, and J. J. Wharton, "Measurement of the principal refractive indices of thin films deposited at oblique incidence," J. Opt. Soc. Am. A 2, 1693-1697 (1985).
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    • Hodgkinson, I.J.1    Horowitz, F.2    Macleod, H.A.3    Sikkens, M.4    Wharton, J.J.5
  • 5
    • 0004659061 scopus 로고
    • Materials for birefringent coatings
    • Q. H. Wu and I. J. Hodgkinson, "Materials for birefringent coatings," Opt. Photon. News 5(5), S9-S10 (1994).
    • (1994) Opt. Photon. News , vol.5 , Issue.5
    • Wu, Q.H.1    Hodgkinson, I.J.2
  • 6
    • 0028493361 scopus 로고
    • Determination of optical constants of absorbing crystalline thin films from reflectance and transmittance measurements with oblique incidence
    • H. Wang, "Determination of optical constants of absorbing crystalline thin films from reflectance and transmittance measurements with oblique incidence," J. Opt. Soc. Am. A 11, 2331-2337 (1994).
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    • Wang, H.1
  • 8
    • 0030180732 scopus 로고    scopus 로고
    • Determination of the refractive indices of highly biaxial anisotropic coatings using guided modes
    • H. Jänchen, D. Endelema, N. Kaiser, and F. Flory, "Determination of the refractive indices of highly biaxial anisotropic coatings using guided modes," Pure Appl. Opt. 5, 405-415 (1996).
    • (1996) Pure Appl. Opt. , vol.5 , pp. 405-415
    • Jänchen, H.1    Endelema, D.2    Kaiser, N.3    Flory, F.4
  • 9
    • 0000087967 scopus 로고    scopus 로고
    • Empirical equations for the principal refractive indices and column angle of obliquely-deposited films of tantalum oxide, titanium oxide and zirconium oxide
    • I. J. Hodgkinson, Qi hong Wu, and J. A. Hazel, "Empirical equations for the principal refractive indices and column angle of obliquely-deposited films of tantalum oxide, titanium oxide and zirconium oxide," Appl. Opt. 37, 2653-2659 (1998).
    • (1998) Appl. Opt. , vol.37 , pp. 2653-2659
    • Hodgkinson, I.J.1    Wu, Q.H.2    Hazel, J.A.3
  • 11
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    • MATLAB is a trademark of The MathsWorks, Inc., 24 Prime Park Way, Natick, MA 01760
    • MATLAB is a trademark of The MathsWorks, Inc., 24 Prime Park Way, Natick, MA 01760.
  • 12
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    • Transmission-mode perpendicular incidence ellipsometry of anisotropic thin films
    • Q. H. Wu and I. J. Hodgkinson, "Transmission-mode perpendicular incidence ellipsometry of anisotropic thin films," J. Opt. Nouvelle Rev. Opt. 25, 43-49 (1994).
    • (1994) J. Opt. Nouvelle Rev. Opt. , vol.25 , pp. 43-49
    • Wu, Q.H.1    Hodgkinson, I.J.2
  • 13
    • 1542687615 scopus 로고
    • Optical Interference Coatings, Florin Abeles, Ed.
    • I. J. Hodgkinson and Q. H. Wu, in Optical Interference Coatings, Florin Abeles, Ed., Proc. SPIE 2253, 882-892 (1994).
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    • Hodgkinson, I.J.1    Wu, Q.H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.