Interfacial shape and contact-angle measurement of transparent samples with confocal interference microscopy

Optics Letters

Volumn 25, Issue 7, 2000, Pages 478-480

  Fischer, David G ^a   Ovryn, Ben ^a,b  

^a NASA GLENN RESEARCH CENTER   (United States)

^b Case Western Reserve University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL PATH LENGTH (OPL);

ALGORITHMS; INTERFACES (MATERIALS); ITERATIVE METHODS; LIGHT INTERFERENCE; PHASE SHIFT; SILICON WAFERS;

LIGHT REFLECTION;

EID: 0001653354     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.25.000478     Document Type: Article

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