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Volumn 86, Issue 8, 1999, Pages 4192-4198

Sensitivity of near-edge x-ray absorption fine structure spectroscopy to ion beam damage in diamond films

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Indexed keywords


EID: 0001643244     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371346     Document Type: Article
Times cited : (54)

References (29)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.