Polarization dependence of trap detectors

Metrologia

Volumn 33, Issue 3, 1996, Pages 207-213

  Goebel, R ^a   Yilmaz, S ^a,b   Pello, R ^a  

^a PAVILLON DE BRETEUIL   (France)

^b BIPM ^*

Author keywords

[No Author keywords available]

Indexed keywords

CRYOGENIC RADIOMETRY; SILICON TRAP DETECTORS;

CRYOGENICS; ELECTRONIC DENSITY OF STATES; LIGHT MEASUREMENT; LIGHT POLARIZATION; LIGHT TRANSMISSION; MATHEMATICAL MODELS; PHOTODIODES; RADIOMETRY; SILICON SENSORS; STANDARDS;

RADIATION DETECTORS;

EID: 0030372741     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/33/3/3     Document Type: Article

References (9)

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