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Volumn 77, Issue 26, 2000, Pages 4392-4394
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Decrease in gap states at ultrathin SiO2/Si interfaces by crown-ether cyanide treatment
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001621089
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1332982 Document Type: Article |
Times cited : (38)
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References (19)
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