"millikelvin-stabilized cell" for x-ray diffraction measurements with a function of sensing thermal anomalies

Review of Scientific Instruments

Volumn 69, Issue 9, 1998, Pages 3298-3299

  Tozaki, K ^a   Ishii, C ^a   Izuhara, O ^b   Tsuda, N ^b   Yoshimura, Y ^b   Iwasaki, H ^b   Noda, Y ^c   Kojima, A ^d  

^a CHIBA UNIVERSITY   (Japan)

^b RITSUMEIKAN UNIVERSITY   (Japan)

^c SHIMANE UNIVERSITY   (Japan)

^d UNIVERSITY OF SHIGA PREFECTURE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001530979     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149114     Document Type: Article

References (2)

1. A. Kojima, I. Ishii, K. Tozaki, S. Matsuda, T. Nakayama, N. Tsuda, Y. Yoshimura, and H. Iwasaki, Rev. Sci. Instrum. 68, 2301 (1997).
2. K. Tozaki, C. Ishii, Y. Noda, Y. Yoshimura, and A. Kojima, Phys. Lett. A (to be submitted).