Fine temperature stabilizer for x-ray diffraction measurements

Review of Scientific Instruments

Volumn 68, Issue 6, 1997, Pages 2301-2304

  Kojima, A ^a   Ishii, C ^b   Tozaki, K ^b   Matsuda, S ^b   Nakayama, T ^c   Tsuda, N ^c   Yoshimura, Y ^c   Iwasaki, H ^c  

^a UNIVERSITY OF SHIGA PREFECTURE   (Japan)

^b CHIBA UNIVERSITY   (Japan)

^c RITSUMEIKAN UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

HEATING EQUIPMENT; LEAD COMPOUNDS; PHASE TRANSITIONS; SINGLE CRYSTALS; TEMPERATURE CONTROL; THERMODYNAMIC STABILITY; THERMOELECTRIC EQUIPMENT; THREE TERM CONTROL SYSTEMS;

TEMPERATURE HOMOGENEITY; TEMPERATURE STABILIZERS; X RAY DIFFRACTION MEASUREMENTS;

X RAY DIFFRACTION ANALYSIS;

EID: 0031168101     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148139     Document Type: Article

References (15)

1. A. Kojima and F. Akao, J. Phys. Soc. Jpn. 51, 2377 (1982).
2. A. Kojima, K. Tozaki, and F. Akao, Rev. Sci. Instrum. 57, 1179 (1986).
3. S. Hoshino, T. Sakuma, and Y. Fujii, J. Phys. Soc. Jpn. 47, 1252 (1979).
4. S. Hoshino, T. Sakuma, and Y. Fujii, J. Phys. Soc. Jpn. 45, 705 (1978).
5. D. Sarid and D. S. Cannell, Rev. Sci. Instrum. 45, 1082 (1974).
6. J. Dratler, Rev. Sci. Instrum. 45, 1435 (1974).
7. F. Barone, Rev. Sci. Instrum. 66, 4051 (1995).
8. C. P. Mudd and H. Tipton, Rev. Sci. Instrum. 58, 2110 (1987).
9. P. T. C. So, S. M. Gruner, and E. Shyamsunder, Rev. Sci. Instrum. 63, 1763 (1992).
10. K. Tozaki, C. Ishii, A. Kojima, and Y. Noda, the results of the thermal anomalies at the phase transition points will be published elsewhere.
11. C. Møller, Mat. Tys. Medd. Dan. Vid. 32, No. 2 (1959).
12. N. T. Jensen, J. Chem. Phys. 50, 559 (1969).
13. S. Hirotu and S. Sawada, Phys. Lett. 28A, 762 (1969).
14. Y. Yoshimura, N. Tsuda, and K. Shimaoka, Memoirs of the Research Institute of Science and Engineering, Ritsumeikan University, No. 41, 21 (1982).
15. R. Rudman, Low Temperature X-ray Diffraction (Plenum, New York, 1976), p. 6.