Extension of Tsu-Esaki model for effective mass effects in resonant tunneling

Applied Physics Letters

Volumn 72, Issue 22, 1998, Pages 2829-2831

  Schulman, J N ^a  

^a Hughes Aircraft Co   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001514903     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121471     Document Type: Article

References (8)

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2. A recent review can be found in J. P. Sun, G. I. Haddad, P. Mazumder, and J. N. Schulman, Proc. IEEE 86, 641 (1998).
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4. E. E. Mendez, J. Nocera, and W. I. Wang, Phys. Rev. B 45, 3910 (1992).
5. J. N. Schulman, H. J. De Los Santos, and D. H. Chow, IEEE Electron Device Lett. 17, 220 (1996).
6. A. T. Hunter and J. N. Schulman, Proceedings of the 24th International Symposium on Compound Semiconductors in San Diego, September 1997. Accepted for publication in Inst. Phys. Conf. Ser.
7. T. B. Boykin, R. E. Carnahan, and K. P. Martin, Phys. Rev. B 51, 2273 (1995);
8. T. B. Boykin, 51, 4289 (1995).