Interfacial chemical effect evidenced on SERS spectra of polyaniline thin films deposited on rough metallic supports

Journal of Raman Spectroscopy

Volumn 30, Issue 12, 1999, Pages 1105-1113

  Baibarac, M ^a   Mihut, L ^a   Louarn, G ^b   Mevellec, J Y ^b   Wery, J ^b   Lefrant, S ^b   Baltog, I ^a  

^a NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

^b INSTITUT DES MATÉRIAUX JEAN ROUXEL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BOND STRENGTH (CHEMICAL); CHARGE TRANSFER; CONDUCTIVE FILMS; CYCLIC VOLTAMMETRY; ELECTRIC EXCITATION; ELECTROMAGNETIC FIELDS; GOLD DEPOSITS; POLYANILINE; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SILVER; SURFACE PLASMONS; SURFACE SCATTERING; THIN FILMS;

CHEMICAL EFFECT; EMERALDINE BASE; EMERALDINE SALT; ENHANCED RAMAN SCATTERING; INTERFACIAL CHEMICALS; METAL SURFACES; METALLIC SUPPORT; POLYANILINE THIN FILMS; SURFACE ENHANCED RAMAN; SURFACE-ENHANCED RAMAN SCATTERING SPECTRUM;

MOLECULES;

EID: 0001500318     PISSN: 03770486     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1097-4555(199912)30:12<1105::aid-jrs507>3.0.co;2-3     Document Type: Article

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