Scanning Force Microscopies Can Image Patterned Self-Assembled Monolayers

Langmuir

Volumn 11, Issue 3, 1995, Pages 825-831

  Wilbur, James L ^a   Biebuyck, Hans A ^a   Macdonald, John C ^a   Whitesides, George M ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL FUNCTIONALITY; CONTRAST; FORCE MODULATION MICROSCOPY; LATERAL FORCE MICROSCOPY; MICROCONTACT PRINTING; NORMAL FORCE MICROSCOPY; SCANNING FORCE MICROSCOPY; SELF ASSEMBLED MONOLAYERS;

ATMOSPHERIC HUMIDITY; IMAGING TECHNIQUES; MICROSCOPIC EXAMINATION; MORPHOLOGY; TRIBOLOGY;

MONOLAYERS;

EID: 0029275735     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la00003a025     Document Type: Article

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