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Volumn 72, Issue 11, 1998, Pages 1293-1295
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Asymmetric microtrenching during inductively coupled plasma oxide etching in the presence of a weak magnetic field
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001487049
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.121068 Document Type: Article |
Times cited : (76)
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References (8)
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