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Volumn 72, Issue 11, 1998, Pages 1293-1295

Asymmetric microtrenching during inductively coupled plasma oxide etching in the presence of a weak magnetic field

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Indexed keywords


EID: 0001487049     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121068     Document Type: Article
Times cited : (76)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.