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Volumn 467-468, Issue PART II, 2001, Pages 872-876

Scanning hard X-ray microscope with tantalum phase zone plate at the Hyogo-BL (BL24XU) of SPring-8

Author keywords

Scanning microscope; X ray fluorescence analysis; X ray microscope; Zone plate

Indexed keywords


EID: 0001484513     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00504-6     Document Type: Article
Times cited : (15)

References (8)
  • 8
    • 84913924282 scopus 로고
    • IUPAC, Pure Appl. Chem. 45 (1976) 99.
    • (1976) Pure Appl. Chem. , vol.45 , pp. 99


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.