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Applied Surface Science

Volumn 136, Issue 3, 1998, Pages 178-188

XPS studies of the nitridation of MoO 3 thin films on alumina and silica supports

(5) Leung, Y L a Wong, P C a Zhou, M Y a Mitchell, K A R a Smith, K J a

a UNIVERSITY OF BRITISH COLUMBIA (Canada)

Author keywords

MoO 3 thin films; Nitridation; X ray photoelectron spectroscopy

Indexed keywords

EID: 0001481399 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(98)00343-2 Document Type: Article

Times cited : (11)

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