Measurement of resistance and spin-memory loss (spin relaxation) at interfaces using sputtered current perpendicular-to-plane exchange-biased spin valves

Physical Review B - Condensed Matter and Materials Physics

Volumn 62, Issue 2, 2000, Pages 1178-1185

  Park, Wanjun ^a   Baxter, David V ^a   Steenwyk, S ^a   Moraru, I ^a   Pratt, W ^a   Bass, J ^a  

^a MICHIGAN STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001475646     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.62.1178     Document Type: Article

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