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Physical Review B - Condensed Matter and Materials Physics

Volumn 54, Issue 12, 1996, Pages 8882-8891

X-ray photoelectron-diffraction study of intermixing and morphology at the Ge/Si(001) and Ge/Sb/Si(001) interface

(6) Gunnella, R a Castrucci, P a Pinto, N a Davoli, I a Sebilleau D a De Crescenzi, M a

a UNIVERSITY OF CAMERINO (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001589466 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.54.8882 Document Type: Article

Times cited : (41)

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