Doping and defect inhomogeneities of polypyrrole tosylate films as revealed by μ-NEXAFS

Materials Science and Engineering C

Volumn 8-9, Issue , 1999, Pages 257-265

  Mikalo, R P ^a   Hoffmann, P ^a   Heller, Th ^a   Batchelor, D R ^a   Appel, G ^a   Schmeisser D ^a  

^a Angewandte Physik Sensorik   (Germany)

Author keywords

Inhomogeneities; NEXAFS; Polypyrrole PEEM

Indexed keywords

EID: 0001460274     PISSN: 09284931     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0928-4931(99)00076-4     Document Type: Article

References (10)

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3. R.P. Mikalo, P. Hoffmann, O. Böhme, D. Schmeißer, Doping Inhomogeneities in Polypyrrole Films: A Photoemission Electron Microscope (PEEM) and Spectro-Microscopy (μ-NEXAFS) Study, BESSY-Jahresbericht, 1997, p. 482.
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7. Schmeißer D., Bartl A., Dunsch L., Naarmann H., Göpel W. Electronic and magnetic properties of polypyrrole films depending on their one-dimensional and two-dimensional microstructures. Synth. Met. 93:1998;43.
8. Appel G. Synth. Met. 83:1996;197.
9. Schmeißer D., Naarmann H., Göpel W. The two-dimensional structure of polypyrrole films. Synth. Met. 59:1993;211-221.
10. G. Appel, O. Böhme, D. Schmeißer, NEXAFS-Spectroscopy of Differently Doped Polypyrroles, Bessy Jahresbericht, 1997, p. 253.