Magnetic susceptibility and microstructure of hydrogenated amorphous silicon measured by nuclear magnetic resonance on a single thin film

Applied Physics Letters

Volumn 78, Issue 4, 2001, Pages 466-468

  Baugh, Jonathan ^a   Han, Daxing ^a   Kleinhammes, Alfred ^a   Wu, Yue ^a  

^a University of North Carolina at Chapel Hill   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001445302     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1341217     Document Type: Article

References (18)

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