Pressure and temperature dependence of the absorption edge of a thick Ga0.92In0.08As0.985N0.015 layer

Applied Physics Letters

Volumn 73, Issue 25, 1998, Pages 3703-3705

  Perlin, Piotr ^a   Subramanya, Sudhir G ^a   Mars, Dan E ^b   Kruger, Joachim ^a   Shapiro, Noad A ^a   Siegle, Henrik ^a   Weber, Eicke R ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001428988     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122869     Document Type: Article

References (11)

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