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Volumn 352, Issue 1-2, 1999, Pages 114-118

Growth and morphology of Te films on Mo

Author keywords

Atomic force microscopy (AFM); Electron emission; Growth mechanism; Molybdenum; Tellurium; X ray photoelectron spectroscopy (XPS)

Indexed keywords


EID: 0001422507     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00383-1     Document Type: Article
Times cited : (10)

References (22)
  • 19
    • 0004033098 scopus 로고
    • Chapter 2, 2nd ed. Interscience, New York
    • R.W.G. Wyckoff, Crystal Structures, Chapter 2, 2nd ed. Vol. 1, Interscience, New York, 1963.
    • (1963) Crystal Structures , vol.1
    • Wyckoff, R.W.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.