Structural and electrical properties of crystalline (1-x)Ta2O5-xAl2O3 thin films fabricated by metalorganic solution deposition technique

Applied Physics Letters

Volumn 71, Issue 10, 1997, Pages 1341-1343

  Joshi, P C ^a   Stowell, S ^a   Desu, S B ^a  

^a Virginia Polytechnic Institute and State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001414363     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119888     Document Type: Article

References (18)

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