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Volumn 72, Issue 3, 1998, Pages 308-310

180° ferroelectric domains in polycrystalline BaTiO3 thin films

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001382001     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120720     Document Type: Article
Times cited : (19)

References (14)
  • 9
    • 21544444077 scopus 로고
    • in edited by S. Amelinckx, R. Gevers, and J. Van Landuyt North-Holland, Amsterdam
    • M. J. Whelan, in Diffraction and Imaging Techniques in Materials Science, edited by S. Amelinckx, R. Gevers, and J. Van Landuyt (North-Holland, Amsterdam, 1978), Vol. 1, p. 56.
    • (1978) Diffraction and Imaging Techniques in Materials Science , vol.1 , pp. 56
    • Whelan, M.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.