Rotating-compensator multichannel ellipsometry for characterization of the evolution of nonuniformities in diamond thin-film growth

Applied Physics Letters

Volumn 72, Issue 8, 1998, Pages 900-902

  Lee, Joungchel ^a   Rovira, P I ^a   An, Ilsin ^a   Collins, R W ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001364261     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120930     Document Type: Article

References (13)

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