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Volumn 82, Issue 9, 1997, Pages 4577-4585

Kinetics and mechanisms of TiN oxidation beneath Pt thin films

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Indexed keywords


EID: 0001340529     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366194     Document Type: Article
Times cited : (19)

References (28)
  • 3
    • 0009798534 scopus 로고
    • C. A. Crider and J. M. Poate, Appl. Phys. Lett. 36, 417 (1980); C. S. Peterson, J. E. E. Baglin, J. J. Dempsey, F. M. d'Heurle, and S. J. La Placa, J. Appl. Phys. 53, 4866 (1982).
    • (1980) Appl. Phys. Lett. , vol.36 , pp. 417
    • Crider, C.A.1    Poate, J.M.2
  • 6
    • 0001410026 scopus 로고    scopus 로고
    • US Patent No. 5,381,302 (10 August, 1993)
    • T. Sakuma, S. Yamamichi, S. Matsubara, H. Yamaguchi, and Y. Miyasaka, Appl. Phys. Lett. 57, 2431 (1990); G. S. Sandhu and P. C. Fazan, US Patent No. 5,381,302 (10 August, 1993).
    • Sandhu, G.S.1    Fazan, P.C.2
  • 22
    • 85033160843 scopus 로고    scopus 로고
    • note
    • Identical results are obtained because the perimeter-to-area ratio is exactly 2/d for any regular polygon, where d is the diameter of the inscribed circle.
  • 23
    • 85033166138 scopus 로고    scopus 로고
    • note
    • The deviation from linearity can be much larger, however, if the assumption of isotropic oxidation in the TiN is removed. The Pt/TiN interface may be a "short-circuit" path for oxygen diffusion. In the extreme case of both short circuit Pt grain boundary and Pt/TiN interfacial diffusion of oxygen, the oxygen activity along this interface will be nearly constant, and the oxidation kinetics will be identical to those for bare TiN.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.