-
3
-
-
0009798534
-
-
C. A. Crider and J. M. Poate, Appl. Phys. Lett. 36, 417 (1980); C. S. Peterson, J. E. E. Baglin, J. J. Dempsey, F. M. d'Heurle, and S. J. La Placa, J. Appl. Phys. 53, 4866 (1982).
-
(1980)
Appl. Phys. Lett.
, vol.36
, pp. 417
-
-
Crider, C.A.1
Poate, J.M.2
-
4
-
-
0020160681
-
-
C. A. Crider and J. M. Poate, Appl. Phys. Lett. 36, 417 (1980); C. S. Peterson, J. E. E. Baglin, J. J. Dempsey, F. M. d'Heurle, and S. J. La Placa, J. Appl. Phys. 53, 4866 (1982).
-
(1982)
J. Appl. Phys.
, vol.53
, pp. 4866
-
-
Peterson, C.S.1
Baglin, J.E.E.2
Dempsey, J.J.3
D'Heurle, F.M.4
La Placa, S.J.5
-
5
-
-
0001410026
-
-
T. Sakuma, S. Yamamichi, S. Matsubara, H. Yamaguchi, and Y. Miyasaka, Appl. Phys. Lett. 57, 2431 (1990); G. S. Sandhu and P. C. Fazan, US Patent No. 5,381,302 (10 August, 1993).
-
(1990)
Appl. Phys. Lett.
, vol.57
, pp. 2431
-
-
Sakuma, T.1
Yamamichi, S.2
Matsubara, S.3
Yamaguchi, H.4
Miyasaka, Y.5
-
6
-
-
0001410026
-
-
US Patent No. 5,381,302 (10 August, 1993)
-
T. Sakuma, S. Yamamichi, S. Matsubara, H. Yamaguchi, and Y. Miyasaka, Appl. Phys. Lett. 57, 2431 (1990); G. S. Sandhu and P. C. Fazan, US Patent No. 5,381,302 (10 August, 1993).
-
-
-
Sandhu, G.S.1
Fazan, P.C.2
-
7
-
-
0026982218
-
-
A. Grill, W. Kane, J. Viggiano, M. Brady, and R. Laibowitz, J. Mater. Res. 7, 3260 (1992).
-
(1992)
J. Mater. Res.
, vol.7
, pp. 3260
-
-
Grill, A.1
Kane, W.2
Viggiano, J.3
Brady, M.4
Laibowitz, R.5
-
8
-
-
3643060236
-
-
J. O. Olowolafe, R. E. Jones, Jr., A. Campbell, C. R. I. Hedge, C. J. Mogab, and R. B. Gregory, J. Appl. Phys. 73, 1764 (1993).
-
(1993)
J. Appl. Phys.
, vol.73
, pp. 1764
-
-
Olowolafe, J.O.1
Jones Jr., R.E.2
Campbell, A.3
Hedge, C.R.I.4
Mogab, C.J.5
Gregory, R.B.6
-
9
-
-
0029371576
-
-
K. Takemura, S. Yamamichi, P.-Y. Lesaicherre, K. Tokashiki, H. Miyamoto, H. Ono, Y. Miyasaka, and M. Yoshida, Jpn. J. Appl. Phys., Part 1 34, 5224 (1995).
-
(1995)
Jpn. J. Appl. Phys., Part 1
, vol.34
, pp. 5224
-
-
Takemura, K.1
Yamamichi, S.2
Lesaicherre, P.-Y.3
Tokashiki, K.4
Miyamoto, H.5
Ono, H.6
Miyasaka, Y.7
Yoshida, M.8
-
10
-
-
0020748299
-
-
I. Suni, D. Sigurd, K. T. Ho, and M.-A. Nicolet, J. Electrochem. Soc. 130, 1210 (1983).
-
(1983)
J. Electrochem. Soc.
, vol.130
, pp. 1210
-
-
Suni, I.1
Sigurd, D.2
Ho, K.T.3
Nicolet, M.-A.4
-
15
-
-
0001795468
-
-
edited by J. R. Tesmer and M. Nastasi MRS, Pittsburgh, PA
-
J. A. Leavitt, L. C. McIntyre, Jr., and M. R. Weller, Handbook of Modern Ion Beam Materials Analysis, edited by J. R. Tesmer and M. Nastasi (MRS, Pittsburgh, PA, 1995), pp. 37-81.
-
(1995)
Handbook of Modern Ion Beam Materials Analysis
, pp. 37-81
-
-
Leavitt, J.A.1
McIntyre Jr., L.C.2
Weller, M.R.3
-
16
-
-
43949163416
-
-
H.-S. Cheng, H. Shen, J. Tang, and F. Yang, Nucl. Instrum. Methods Phys. Res. B 83, 449 (1993).
-
(1993)
Nucl. Instrum. Methods Phys. Res. B
, vol.83
, pp. 449
-
-
Cheng, H.-S.1
Shen, H.2
Tang, J.3
Yang, F.4
-
18
-
-
13944274472
-
-
D. McIntyre, J. E. Greene, G. Hakansson, J.-E. Sundgren, and W.-D. Münz, J. Appl. Phys. 67, 1542 (1990).
-
(1990)
J. Appl. Phys.
, vol.67
, pp. 1542
-
-
McIntyre, D.1
Greene, J.E.2
Hakansson, G.3
Sundgren, J.-E.4
Münz, W.-D.5
-
22
-
-
85033160843
-
-
note
-
Identical results are obtained because the perimeter-to-area ratio is exactly 2/d for any regular polygon, where d is the diameter of the inscribed circle.
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-
-
-
23
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85033166138
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note
-
The deviation from linearity can be much larger, however, if the assumption of isotropic oxidation in the TiN is removed. The Pt/TiN interface may be a "short-circuit" path for oxygen diffusion. In the extreme case of both short circuit Pt grain boundary and Pt/TiN interfacial diffusion of oxygen, the oxygen activity along this interface will be nearly constant, and the oxidation kinetics will be identical to those for bare TiN.
-
-
-
-
26
-
-
36449002472
-
-
K. Sreenivas, I. Reaney, T. Maeder, N. Setter, C. Jagadish, and R. G. Elliman, J. Appl. Phys. 75, 232 (1994).
-
(1994)
J. Appl. Phys.
, vol.75
, pp. 232
-
-
Sreenivas, K.1
Reaney, I.2
Maeder, T.3
Setter, N.4
Jagadish, C.5
Elliman, R.G.6
-
27
-
-
3242868416
-
-
edited by B. A. Tuttle, S. B. Desu, R. Ramesh, and T. Shiosaki Mater. Res. Soc., Pittsburgh, PA
-
F. Varniere, B. E. Kim, B. Agius, R. Bisaro, J. Olivier, G. Chevrier, H. Achard, H. Mace, and L. Peccoud, Ferroelectric Thin Films IV, edited by B. A. Tuttle, S. B. Desu, R. Ramesh, and T. Shiosaki (Mater. Res. Soc., Pittsburgh, PA, 1995), p. 235.
-
(1995)
Ferroelectric Thin Films IV
, pp. 235
-
-
Varniere, F.1
Kim, B.E.2
Agius, B.3
Bisaro, R.4
Olivier, J.5
Chevrier, G.6
Achard, H.7
Mace, H.8
Peccoud, L.9
-
28
-
-
0000993680
-
-
G. R. Fox, S. Trolier-McKinstry, S. B. Krupanidhi, and L. M. Casas, J. Mater. Res. 10, 1508 (1995).
-
(1995)
J. Mater. Res.
, vol.10
, pp. 1508
-
-
Fox, G.R.1
Trolier-McKinstry, S.2
Krupanidhi, S.B.3
Casas, L.M.4
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