Sensitivity of multimode bidirectional optoelectronic modules to electrostatic discharges

Microelectronics Reliability

Volumn 39, Issue 12, 1999, Pages 1863-1871

  Neitzert, H C ^a,b   Piccirillo, A ^a  

^a Centra Studi Laboratori T   (Italy)

^b UNIVERSITY OF SALERNO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001323462     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(99)00196-1     Document Type: Article

References (10)

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7. ESD STM5.1, Sensitivity Testing, Human Body Model, Component Level, ESD Association, Rome, 1998.
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9. Neitzert HC, Cappa V, Crovato R. Influence of the device geometry and inhomogeneity on the elctrostatic discharge sensitivity of InGaAs/InP avalanche photodetectors. In: Proc. of the 19th EOS/ESD Symposium'97, Santa Clara. 1997. p. 18.
10. Diep T, Phatak SB, Yoo DT. PIN Photodetectors -The ESD Bottleneck in Laser Packages. In: Proc. of the EOS/ESD Symposium'92. 1992. p. 159.