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Volumn 13, Issue 4, 1997, Pages 595-599

Direct ICP-AES Determination of Trace Impurities in Silicon Dioxide Using Fluorinating Electrothermal Vaporization with Slurry Sampling

Author keywords

Electrothermal vaporization; Inductively coupled plasma atomic emission spectroscopy; Polytetrafluoroethylene emulsion; Selective volatilization; Silicon dioxide slurry; Trace impurities

Indexed keywords

ATOMIC EMISSION SPECTROSCOPY; ELECTRIC HEATING; EMULSIFICATION; INDUCTIVELY COUPLED PLASMA; PARTICLE SIZE; PARTICLE SIZE ANALYSIS; POLYTETRAFLUOROETHYLENES; SILICA; SILICON OXIDES; VAPORIZATION;

EID: 0642362216     PISSN: 09106340     EISSN: None     Source Type: Journal    
DOI: 10.2116/analsci.13.595     Document Type: Article
Times cited : (13)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.