The density of states in silicon nanostructures determined by space-charge-limited current measurements

Journal of Applied Physics

Volumn 84, Issue 11, 1998, Pages 6157-6161

  Matsumoto, Takahiro ^a   Mimura, Hidenori ^b   Koshida, Nobuyoshi ^c   Masumoto, Yasuaki ^a,d  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

^c TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY   (Japan)

^d UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001238888     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368930     Document Type: Article

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