Comments about the effects of nonuniform mass loading on a quartz crystal microbalance

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 45, Issue 5, 1998, Pages 1123-1124

  Vig, John R ^a   Ballato, Arthur ^a  

^a US Army Communications and Electronics Command   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001200659     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/58.726433     Document Type: Article

References (7)

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2. R. J. Williamson, Non-destructive means for determining mode shape in thickness-shear resonators, Proc. IEEE Int. Freq. Contr. Symp., May 1990, pp. 424-436.
3. C D Stockbridge, Resonance frequency versus mass added to quartz crystals,'' in Vacuum Microbalance Techniques, vol. 5, New York: Plenum, 1966, pp. 193-205.
4. D. E. Pieice, Y. Kini, and J. R. Vig, A température insensitive quartz microbalance, IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 45, no. 5, pp. 1238-1245, 1998.
5. M. Thompson and G. L. Hayward, Mass response of the thickness-shear mode acoustic wave sensor in liquids as a central misleading dogma, Proc. IEEE Int. Freq. Contr. Symp., 1997, pp. 114-119.
6. G. L. Dybwad, A sensitive new method for the determination of adhesive bonding between a particle and a substrate, J. Appl. Phys., vol. 58, pp. 2789-2790, 1985.
7. R. Rechma.nn, lieber Dickenschwingungen piezoelektrischer Kristallplatten, Archiv der Elektrischen U ebertragung, vol. 6, pp. 361 368, Sep. 1952.