Determining adsorbate structures from substrate emission X-ray photoelectron diffraction

Surface Science

Volumn 472, Issue 1-2, 2001, Pages 125-132

  Muntwiler, Matthias ^a,b   Auwärter, Willi ^a   Baumberger, Felix ^a   Hoesch, Moritz ^a,b   Greber, Thomas ^a   Osterwalder, Jürg ^a  

^a UNIVERSITY OF ZURICH   (Switzerland)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

Boron nitride; Electron solid diffraction; Nickel; Photoelectron diffraction; Surface structure, morphology, roughness, and topography

Indexed keywords

EID: 0001184318     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00928-6     Document Type: Article

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