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Volumn 37, Issue 28, 1998, Pages 6716-6720

Ultrastable absolute-phase common-path optical profiler based on computer-generated holography

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EID: 0001114150     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.006716     Document Type: Article
Times cited : (12)

References (9)
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  • 2
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    • Differential phase contrast microscope with 1À depth resolution
    • H. K. Wickramasinghe, S. Ameri, and C. W. See, “Differential phase contrast microscope with 1À depth resolution, ” Electron. Lett. 18, 973-975 (1982).
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    • Wickramasinghe, H.K.1    Ameri, S.2    See, C.W.3
  • 3
    • 0141543135 scopus 로고    scopus 로고
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    • M. B. Suddendorf, M. G. Somekh, and C. W. See, “Single-probe-beam differential amplitude and phase scanning interferometer, ” Appl. Opt. 36, 6202-6210 (1997).
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    • Suddendorf, M.B.1    Somekh, M.G.2    See, C.W.3
  • 4
    • 0021463792 scopus 로고
    • Optical heterodyne profilometer
    • C. C. Huang, “Optical heterodyne profilometer, ” Opt. Eng. 23, 365-370 (1984).
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    • Huang, C.C.1
  • 5
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    • Interferometric scanning optical microscope for surface characterization
    • M. J. Offside and M. G. Somekh, “Interferometric scanning optical microscope for surface characterization, ” Appl. Opt. 31, 6772-6782 (1992).
    • (1992) Appl. Opt. , vol.31 , pp. 6772-6782
    • Offside, M.J.1    Somekh, M.G.2
  • 7
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    • Calibration of numerical aperture effects in interferometric microscope objectives
    • K. Creath, “Calibration of numerical aperture effects in interferometric microscope objectives, ” Appl. Opt. 28, 3333-3338 (1989).
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  • 8
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    • Scanning heterodyne confocal differential phase and intensity microscope
    • M. G. Somekh, M. S. Valera, and R. K. Appel, “Scanning heterodyne confocal differential phase and intensity microscope, ” Appl. Opt. 34, 4857-4868 (1995).
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    • Somekh, M.G.1    Valera, M.S.2    Appel, R.K.3
  • 9
    • 0019927495 scopus 로고
    • Fourier transform method of fringe-pattern analysis for computer-based topography and interferometry
    • M. Takeda, H. Ina, and S. Kobayashi, “Fourier transform method of fringe-pattern analysis for computer-based topography and interferometry, ” J. Opt. Soc. Am. 72, 156-160 (1982).
    • (1982) J. Opt. Soc. Am. , vol.72 , pp. 156-160
    • Takeda, M.1    Ina, H.2    Kobayashi, S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.