Microstructure and noise characteristics of Co-Cr-Ta films on ultraflat glass substrates for longitudinal recording disks

Journal of Applied Physics

Volumn 87, Issue 9 III, 2000, Pages 6343-6345

  Noda, Kohki ^a   Kadokura, Sadao ^b   Naoe, Masahiko ^c  

^a IBM JAPAN LTD   (Japan)

^b FTS Corporation   (Japan)

^c TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001104055     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372700     Document Type: Article

References (7)

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5. K. Noda and M. Naoe, Proc. Electrochem. Soc. 98-20, 223 (1998).
6. I. L. Sanders, J. K. Howard, S. E. Lambert, and T. Yogi, J. Appl. Phys. 65, 1234 (1989).
7. T. P. Nolan, R. Sinclair, R. Ranjan, and T. Yamashila, IEEE Trans. Magn. 29, 292 (1993).