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Volumn 73, Issue 12, 1998, Pages 1706-1708
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Experimental evidence for a dual vacancy-interstitial mechanism of self-diffusion in silicon
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001101890
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.122252 Document Type: Article |
Times cited : (39)
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References (13)
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